FEI FIB SEM Focused Ion Beam Scanning Electron Microscope
Description
P/N FP 2067/3
Spare parts included - see pictures
Visit day(s)
By appointment
Visiting days: on appointment between December 2th and January 8th. belgan.pickup@online-auctions.be
Visiting days: on appointment between December 2th and January 8th. belgan.pickup@online-auctions.be
Westerring 15
9700 Oudenaarde
Belgium
Collection day(s)
24/01/2025 - 09:00 to 15:30
29/01/2025 - 09:00 to 17:00
29/01/2025 - 09:00 to 17:00
Westerring 15
9700 Oudenaarde
Belgium